On-Line Testing for VLSI
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.V.V.Saposhnikov and Vl.V.Saposhnikov, aSelf-Cheking Checkers for Balansed Codes, a Automation and Remote Control, Vol. 53, No. ... 321a348, 1992. ... B. Bose and D.J. Lin, aSystematic Unidirectional Error-Detecting Codes, a IEEE Trans .
| Title | : | On-Line Testing for VLSI |
| Author | : | Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan |
| Publisher | : | Springer Science & Business Media - 2013-03-09 |
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